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OPTICAL PROPERTIES LABORATORY
Complutense University at Madrid - Materials Physics Department

Main activities

The main activities carried out at this laboratory of the Materials Physics Department of the UCM are:

Design, synthesis and preparation of materials with desired properties (e.g. nanoparticles, chemical sensors, protective coatings, …)
Structural and optical characterization of materials ( x-ray diffraction, scanning electron microscopy, x-ray absortion spectroscopy, UV-Vis spectroscopy, Luminescence spectroscopy)

                       Area of Interest: Aeronautical & Aerospace
                                                 Mechanical
                                                 Electrical & ELectronics
                                                 Energy
                                                 Chemical
                                                 Biomedical

                       E-mail contact: n.carmona@fis.ucm.es

                Qualified technical personnel who works at the laboratory

                Main publications in the last five years

                Accordance of the laboratory with safety standard regulation

General Info

Instrumentation

Typology	Model	Brand	Specifications	Main application	Year of acquisition	Standard regulations
Vertical tubular furnace	TZF	Carbolite	Up to 1600ºC	Heat treatments	2010	Internal UCM
Systems for coatings application (dip-, spin- and spray-coating)	Home made devices	-	-	Coatings application	2008	Internal UCM
Atomic force microscope	Dulcinea	Nanotec	Dulcinea control unit and WSxM software	Images acquisition of surfaces at nanoscale	After 2005	Internal UCM
X-ray diffraction	X’Pert Pro MRD	Panalytical	X-ray difrractometer for thin films, wafers and solid samples	X-ray diffraction studies (phase analysis)	After 2005	Internal UCM
Scanning electron microscope	6335 F	JEOL	Field Emission with EDS analyses Oxford Instruments X-Max	BSE and SE images acquisition and EDX analyses	2005	Internal UCM
UV-VIS-NIR spectrophotometer	Nanocalc-2000-UV/VIS/NIR	Mikropack	250-1100 nm Deuterium Halogen lamp	Absorption and reflectance spectra acquisition	2005	Internal UCM
UV-VIS-NIR spectrophotometer	3100	Shimadzu	double-beam with an integrating sphere	Absorption and reflectance spectra acquisition	Before 2005	Internal UCM
Fluorescence spectrophotometer	LS-5B	Perkin Elmer	Luminescence spectrometer	Luminescence spectra acquisition	Before 2005	Internal UCM
Optical microscope	BX60M	Olympus	reflecting light accessory	Micrographs acquisition	Before 2005	Internal UCM
Digital photography equipment	DP11	Olympus camera	-	Documentation of samples at macroscopic level	Before 2005	Internal UCM

______________________________________________________________________________________________________________________________________________________

SAPIENZA NANOTECHNOLOGY & NANOSCIENCE LAB
Sapienza University (Rome)

General Info

                       Area of Interest: Aeronautical & Aerospace
                                                 Mechanical
                                                 Electrical & ELectronics
                                                 Energy
                                                 Biomedical

                       E-mail contact: francesco.mura@uniroma1.it

Typology	Model	Brand	Specifications	Main application	Year of acquisition	Standard regulations
FESEM	Auriga 405	Zeiss	0-30 keV EHT, 1 nm nominal resolution	Materials analysis & nanofabrication	2010
Microanalysis	Quantax	Bruker	10 mm2 active area, 123 eV Ka Mn (energy resolution), mounted on the Auriga FESEM	Compositional analysis	2010
Focused ion Beam	Cobra	Physics d' Orsay	1 nm spatial resolution, ionic corrent 20 pA-25 nA, mounted on the Auriga FESEM	Cross section digging and surface modification	2012
Electron Beam Litography	Elphy Quantum	Raith	Writefiled Size from 100 um to 1 mm, 20 nm resolution, mounted on the Auriga FESEM	Nanofabrication and Optical devices	2010
Atomic Force Microscopy	Icon	Veeco/Bruker	Harmonix module, Tuna module	Topogrphical, force and magnetic measurement	2009
Atomic Force Microscopy	Multimode	Veeco/Bruker	Electrochemical Module, STM module, dz resolution < 1 nm	Topographical measurement in wet and dry conditions	2009
Fluorescence Microscopy	Apotome	Zeiss			2009